A complete, turn-key hyperspectral photoluminescence (PL) imaging system for the spatially and spectrally resolved optical characterization of photovoltaic materials and semiconductor devices. The system acquires hyperspectral data-cubes in full-field imaging mode without point-by-point spatial raster scanning of the sample or excitation beam. The system must operate across the visible to near-infrared spectral range and support quantitative absolute photometric measurements.