Deinstallation, relocation, reinstallation, commissioning of the DualBeam FIB-SEM system - Opex

Deinstallation, relocation, reinstallation, commissioning of the DualBeam FIB-SEM system - Opex - PR1262394-3220-P

Dismantling, relocation to a new site, reinstallation, reconnection (re-hook-up), commissioning, calibration and acceptance testing of an existing DualBeam FIB-SEM/FIB-REM system (Focused Ion Beam - Scanning Electron Microscope), manufactured by TESCAN GmbH, model GAIA3 GMH or GAIA3GMH, initially installed in 2018. This includes the existing system components, in particular the Kleindiek micromanipulator, Oxford EDX detector and TOFWERK TOF-SIMS. The scope of work also includes site and room measurements relating to ground vibrations, acoustic influences and magnetic and electromagnetic interference fields. Where necessary, suitable technical interference suppression and compensation measures must be planned and implemented. Following reinstallation, the technical integrity and previous performance of the equipment must be verified by means of documented functional, vacuum, resolution, calibration and performance tests, including a Site Acceptance Test.