The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source

Deadline:16 Nov 2026, 07:00

Summary
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Tender information
Københavns omegn
Type
Contract
Procedure
Open procedure
Ref. number
11227
DTU requires the supply, delivery, installation, commissioning and acceptance of one (1) focused ion beam scanning electron microscope (FIB-SEM) dual-beam platform. The instrument shall serve a multi-user research environment and will be used for high-resolution surface imaging, site-specific cross-sectioning, TEM lamella preparation (including automated workflows), 3D FIB-SEM tomography, gas-assisted deposition and etching, nanoscale manipulation, and elemental microanalysis by energy-dispersive X-ray spectroscopy (EDS) and ToF-SIMS.
Buyer
Danmarks Tekniske Universitet - DTU
buyer-email@mail.com
organization number
Open for offers
30 days left
Important dates
15 Oct - Publication date
16 Nov - Deadline
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