Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)
Deadline:24 Aug 2026, 21:59
Summary
Tender information
Skåne län
Type
Contract
Procedure
Open procedure
Ref. number
V 2026/244
Estimated value
SEK 28,000,000
Duration
11/09/2026 - 11/03/2028
Lund Nano Lab (LNL) at Lund University intends to purchase a Focused Ion Beam Scanning Electron Microscope, in this document referred to as the FIB-SEM, instrument
or equipment. This document lists all the requirements the FIB-SEM must meet.
The instrument is intended to be used for high-resolution imaging, materials analysis and preparing samples for TEM analysis as well as for experiments at the MAX IV
synchrotron.
Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)
.
Buyer
Lunds universitet
202100-3211
sarah.salman@eken.lu.se
Documents
Original notices
Document name | Upload date | File size | |
|---|---|---|---|
| 2 Jul 2026, 00:06 | 11.14 kB | ||
| 2 Jul 2026, 06:54 | 2.53 kB |
Buyer
Lunds universitet
202100-3211
sarah.salman@eken.lu.se
Open for offers
52 days left
Important dates
2 Jul - Publication date
24 Aug - Deadline
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