Metrology SEM+FIB system

Deadline:7 Sept 2026, 10:00

Summary
Lorem ipsum dolor sit amet, consectetur adipiscing elit. Sed do eiusmod tempor incididunt ut labore et dolore magna aliqua. Ut enim ad minim veniam, quis nostrud exercitation ullamco laboris nisi ut aliquip ex ea commodo consequat.
Duis aute irure dolor in reprehenderit in voluptate velit esse cillum dolore eu fugiat nulla pariatur. Excepteur sint occaecat cupidatat non proident, sunt in culpa qui officia deserunt mollit anim id est laborum.
Tender information
The Netherlands
Type
Contract
Procedure
Open procedure
Ref. number
WS2640013718
Estimated value
€1,300,000
Duration
4 years
The main purpose of this FIB/SEM equipment is to perform material milling (cutting), 3D characterization, and cross section analysis of epitaxially grown InP, InGaAs, InAlGaAs and InGaAsP layers on InP substrates. The structures may also contain polymer-based planarization layers, SiOx or SiNx dielectric layers and TiPtAu or NiGeAu metal layers. Levering van één SEM +FIB systeem – Levering van een metal lift-off system Levering van één metal lift-off system
Buyer
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk on
buyer-email@mail.com
organization number

Documents

Document name
Upload date
File size
First document.pdf1 Jan 1970, 00:001 Bytes
Second document.pdf1 Jan 1970, 00:001 Bytes
Deadline passed
Important dates
28 Jul - Publication date
7 Sept - Deadline
Unlock Full Access with Mercell Bidding Business Plus
Start your free trial to explore exclusive features that help you win more tenders, faster:
AI-Powered Tender Insights
Buyer Contact Info
Key Tender Timelines

Already have an account?

Your privacy is important to us

We use cookies to improve your experience and evaluate each item on our site. By clicking further, you accept our use of cookies.