WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTEM

Deadline:6 Jul 2026, 11:30

Tender information

Arr. Leuven

Type

Contract

Procedure

Negotiated with a call for competition

Ref. number

JPA2026ID76

WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTEM

JPA2026ID76 - 1

WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTEM

Buyer

Imec EU Pilot line NV

Documents

Document name	Upload date	File size
First document.pdf	1 Jan 1970, 00:00	1 Bytes
Second document.pdf	1 Jan 1970, 00:00	1 Bytes

Information on this page originates from the following sources: TED

Buyer

Imec EU Pilot line NV

No time limit

20 days left

Important dates

4 Jun - Publication date

6 Jul - Deadline

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