Aquisição de 1 (um) sistema de microscopia duplo de Feixe de Iões Focalizado (FIB) acoplado a Microscópio Eletrónico de Varrimento por emissão de campo (FEG-SEM) para o Laboratório Associado CICECO – Instituto de Materiais de Aveiro

Deadline:28 Jun 2026, 22:59

Tender information
PT16D
PT191
Type
Contract
Procedure
Open procedure
Evaluation criteria
Price, Quality
Ref. number
CP n.º 183 - AAC/CICECO - 04/26
Estimated value
€600,000
Duration
180 days
Aquisição de 1 (um) sistema de microscopia duplo de Feixe de Iões Focalizado (FIB) acoplado a Microscópio Eletrónico de Varrimento por emissão de campo (FEG-SEM) para o Laboratório Associado CICECO – Instituto de Materiais de Aveiro
Buyer
Universidade de Aveiro
buyer-email@mail.com
organization number

Documents

Document name
Upload date
File size
First document.pdf
1 Jan 1970, 00:001 Bytes
Second document.pdf
1 Jan 1970, 00:001 Bytes
Open for offers
14 days left
Important dates
18 May - Publication date
28 Jun - Deadline
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