Tyndall National Institute, University College Cork (UCC) invites tenders for the supply, delivery, installation, commissioning, and validation of an integrated X-ray Photoelectron Spectrometer (XPS) System with Collocated Raman Spectroscopy Module, comprising two primary components: (i) XPS Module: For chemical composition and electronic structure analysis of thin films (metal oxides and 2D materials) produced by Atomic Layer Deposition (ALD) facility within Europe’s first beyond-2 nm System-on-Chip (SoC) pilot line. (ii) Raman Spectroscopy Module: For structural, vibrational, and stress analysis of the same thin-film materials (metal oxides and 2D materials) from the atomic layer processing facility. This fully integrated system will provide essential complementary surface and bulk characterisation capabilities for next-generation ALD materials research within the pilot line facility.